عرض 14401 - 14450 من 17040 مادة
الناشر : Elsevier
كتاب |
Author: Coffer, Jeffery
Author: Abrahams, J. R
Author: Ball, A. M
الناشر : Knovel
Author: Spieler, Helmuth
Author: Ghione, Giovanni
Author: Jaaniso, Raivo
Author: Sharma, B. L.
Author: Williams, Michael E.
Author: Williams, M.E.; Baldwin, D.G.
Author: Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control
Author: McGuire, G.E.
Author: Redaelli, Andrea
Author: Ritchie, David
Author: Sun, Yugang
Author: Sun, Yugang; Rogers, John A.
Author: Ihn, Thomas
Author: Arbiol, Jordi
Author: Dayeh, Shadi A.
Author: Dutta, Niloy K.; Wang, Qiang
Author: Moss, Trevor Simpson
Author: Piprek, Joachim
Author: Bolmen, Richard A
Author: Bolmen, R.A., Jr.
Author: Kupriyanov, L. Yu
Author: Shimura, Fumio
Author: Schäpers, Thomas
Author: Willeke, Gerhard P.; Weber, Eicke R.
Author: Morral, Anna Fontcuberta I; Dayeh, Shadi A.; Jagadish, Chennupati
Author: Dayeh, Shadi A.; Morral, Anna Fontcuberta I; Jagadish, Chennupati
Author: Orton, John W
Author: Mi, Zetian
Author: Suban K. Sahoo
Author: Chaulya, S. K.
Author: Hussain, Chaudhery Mustansar
Author: International Symposium on Sensitivity Analysis
Author: Hintz, Kenneth J.
Author: Lynch, Jerome P.; Sohn, Hoon; Wang, Ming L.
Author: Wilson, Jon S.
Author: Sinclair, Ian R.
Author: Sinclair, Ian Robertson
Author: Dey, Nilanjan
Author: Regtien, P. P. L
Author: Regtien, Paul P.L.
Author: Regtien, Paul; Dertien, Edwin
Author: Regtien, P. P. L.
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